发明名称 SEMICONDUCTOR MEMORY
摘要 PURPOSE:To shorten the time required for screening and to reduce the manufacturing cost by providing a screening circuit, when screening is performed for a insulation film of a ferroelectric capacitor of a ferroelectric memory. CONSTITUTION:A screening circuit consists of a word line selecting circuit 21 for a screening mode, a plate line voltage applying circuit 22, and a bit line voltage applying circuit 23. And a prescribed potential difference in which high-low relationship of voltage is alternately inversed, is applied between a second number of pieces of plate lines being more than a first number of pieces of plate lines out of plural plate lines PL and bit line BL with a number of arbitrary times at the time of a screening mode. Thereby, pulse voltage in which polarity is alternately inversed can be applied a number of arbitrary times between both ends of a insulation film of a ferroelectric capacitor C connected between the plate line and the bit line through a MOS transistor Q, and the screening of a ferroelectric film can be efficiently performed.
申请公布号 JPH07287999(A) 申请公布日期 1995.10.31
申请号 JP19940081449 申请日期 1994.04.20
申请人 TOSHIBA CORP;TOSHIBA MICRO ELECTRON KK 发明人 TANAKA SUMIO;KAMATA HIDEYUKI
分类号 G11C14/00;G11C11/22;G11C11/401;G11C29/00;G11C29/06;H01L21/8242;H01L21/8246;H01L27/10;H01L27/105;H01L27/108 主分类号 G11C14/00
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