发明名称 METHOD AND APPARATUS FOR INSPECTING MICROWAVES
摘要 <p>PURPOSE:To obtain a microwave inspection method in which an object, to be detected, which is housed inside a container can be detected without destroying the container, without denaturing a content housed inside the container or without a need of putting a magnetic marking on the object to be inspected and irrespective of whether the weight of the object to be detected is large or small. CONSTITUTION:Circularly polarized waves which are formed by a circularly- polarized-wave generator 16 on the basis of parallel-wave electromagnetic waves at the wavelength of microwaves radiated from an antenna 22b for wave transmission are emitted to an object 5, to be inspected, which is arranged on their propagation axis. By the mutual interference of traveling waves by the circularly polarized waves advancing to the object 5 to be inspected with reflected waves by the circularly polarized waves reflected on the side of the object 5 to be inspected, circularly-polarized-wave standing waves which are turned are formed on the propagation axis. Electric power of the standing waves is detected on a side opposite to the circularly-polarized-wave generator 16 by using the antenna 22b as a boundary, and a statement 4 inside the object 5 to be inspected is detected.</p>
申请公布号 JPH07287071(A) 申请公布日期 1995.10.31
申请号 JP19940078885 申请日期 1994.04.18
申请人 HEWTEC:KK 发明人 HANABUSA HIDEYUKI;TAKUMA MIKIO;MORITOMO MITSUNARI
分类号 G01B15/00;G01N22/00;G01R29/08;G01R29/10;G01V3/12;H01L21/66;(IPC1-7):G01V3/12 主分类号 G01B15/00
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