发明名称 REFLECTANCE MEASURING DEVICE AND REFLECTANCE MEASURING METHOD
摘要 <p>PURPOSE:To measure at a high accuracy even though the measuring surface forms of a work to measure and a standard sample are different, by regulating the sample measuring position and the measuring surface of the work to measure coincide constantly. CONSTITUTION:The light radiated on a sample measuring position 3 by a fiber 2 for projection is reflected by a work to measure at the position 3, and the quantity of light of the received light by a fiber 4 for receiving is measured by a spectroscope or the like. In this case a movable attachment 7 maintains the fibers 2 and 4 at a constant angle in a holder 11, and the parts contacting with the work to measure are expanded and contracted. By regulating the expansion distance L by a regulating handle 8 through the combination of gears, for example, the distance between the fibers 2 and 4 maintained at a constant angle, and the measuring surface of the work to measure is regulated. Consequently, even when the form of the measuring surface of a work to measure is different from the form of the measuring surface of a standard sample, the absolute reflectance of the measured surface can be measured at a high accuracy.</p>
申请公布号 JPH07286958(A) 申请公布日期 1995.10.31
申请号 JP19940101519 申请日期 1994.04.15
申请人 USHIO INC 发明人 KAMEDA HIROYUKI;MIZUNO OSAMU
分类号 G01N21/55;(IPC1-7):G01N21/55 主分类号 G01N21/55
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