发明名称 NON-VOLATILE SEMICONDUCTOR MEMORY
摘要 <p>PURPOSE:To prevent the over write-in by narrowing distribution of threshold value voltage after the write-in. CONSTITUTION:After A control circuit 21 writes data in a desired memory cell of a memory cell array 14, verifies threshold value voltage of a memory cell in which data is written. Consequently, when a memory cell having a threshold value voltage higher than the power supply voltage is detected, a erasing voltage generating circuit 20 supplies negative erasing voltage -Vpp to a memory cell in which data is written for a short time, the threshold value voltage is slightly lowered. Therefore, the over write-in is prevented and distribution of threshold value voltage can be narrowed.</p>
申请公布号 JPH07287989(A) 申请公布日期 1995.10.31
申请号 JP19940081617 申请日期 1994.04.20
申请人 TOSHIBA CORP 发明人 MATSUKAWA HISAHIRO;IMAMIYA KENICHI;WATANABE TOSHIHARU;MATSUI NORIHARU
分类号 G11C17/00;G11C16/02;G11C16/04;G11C16/34;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C16/06;H01L21/824 主分类号 G11C17/00
代理机构 代理人
主权项
地址