发明名称 ADDRESS GENESATOR IS MEMORY TEST DEVICE
摘要 In an address generating device wherein addresses are generated by an address computation part in response to data and control signals read out of an instruction memory and are provided to a memory under test, a command control bit for storing a command control signal is provided in the instruction memory and a command register is provided for storing a command read out of a data area of the instruction memory. The output from the address computation part and the output from the command register are input into a first multiplexer, which selects either one of the two inputs in response to a command control signal read out of the command control bit. The output from the first multiplexer is applied to a descrambler, wherein it is translated to a physical address. A second multiplexer is provided for selecting either one of the outputs from the descrambler and the first multiplexer in such an instance. The second multiplexer is controlled by a descramble inhibit signal read out of a descramble inhibit bit in the instruction memory.
申请公布号 KR950013265(B1) 申请公布日期 1995.10.26
申请号 KR19920004940 申请日期 1992.03.26
申请人 ADBAN TEST K.K. 发明人 OKAJAKI, TADASHI
分类号 G06F11/22;G01R31/3181;G06F12/16;G11C11/401;G11C29/00;G11C29/14;G11C29/56;(IPC1-7):G06F12/16 主分类号 G06F11/22
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