发明名称 SEMICONDUCTOR WAFER EDGE SECTION POLISHING DEVICE
摘要 PURPOSE:To provide a semiconductor wafer edge section polishing device which can improve polishing work efficiency and a yield. CONSTITUTION:In a polishing device which is provided with a cylindrical rotatable polishing cloth 13 and mechanisms 19, 21 which can hold and rotate a wafer 1 in such a way that a wafer edge face to be polished is in contact with a surface of the polishing cloth and polishes a wafer edge section 2 while rotating the wafer 1, a surface roughness detector 27 which is arranged in such a way that a detection end 29 is in proximity to the wafer edge section 3 is provided.
申请公布号 JPH07276229(A) 申请公布日期 1995.10.24
申请号 JP19940065207 申请日期 1994.04.01
申请人 NIPPON STEEL CORP 发明人 ABE KOZO;YOSHIDA TAKAFUMI
分类号 B24B9/00;B24B49/00;B24B49/12 主分类号 B24B9/00
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