发明名称 |
SEMICONDUCTOR WAFER EDGE SECTION POLISHING DEVICE |
摘要 |
PURPOSE:To provide a semiconductor wafer edge section polishing device which can improve polishing work efficiency and a yield. CONSTITUTION:In a polishing device which is provided with a cylindrical rotatable polishing cloth 13 and mechanisms 19, 21 which can hold and rotate a wafer 1 in such a way that a wafer edge face to be polished is in contact with a surface of the polishing cloth and polishes a wafer edge section 2 while rotating the wafer 1, a surface roughness detector 27 which is arranged in such a way that a detection end 29 is in proximity to the wafer edge section 3 is provided. |
申请公布号 |
JPH07276229(A) |
申请公布日期 |
1995.10.24 |
申请号 |
JP19940065207 |
申请日期 |
1994.04.01 |
申请人 |
NIPPON STEEL CORP |
发明人 |
ABE KOZO;YOSHIDA TAKAFUMI |
分类号 |
B24B9/00;B24B49/00;B24B49/12 |
主分类号 |
B24B9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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