发明名称 |
INSPECTION OF BAKING ELECTRODE OF CHIP TYPE ELECTRONIC PART |
摘要 |
PURPOSE:To mainly inspect the solderability of a baking electrode simply and accurately within a relatively short time and to support the accurate preparation of conductive paste good in electrode characteristics. CONSTITUTION:In the inspection of the soldering aptitude of the baking electrodes 12, 12 of a chip type electronic part 10 produced by coating the terminal part of a bare chip 11 with a conductive paste composed of a mixture of a metal powder containing Ag, glass fine particles and an org. vehicle and baking the coated part, the chip type electronic part 10 is allowed to stand in gas containing a predetermined amt. of a sulfur component for a predetermined time and the baking electrodes 12, 12 are optically observed. The surface hue of the electrodes changes corresponding to the exposure degree of the Ag component. |
申请公布号 |
JPH07270400(A) |
申请公布日期 |
1995.10.20 |
申请号 |
JP19940058436 |
申请日期 |
1994.03.29 |
申请人 |
MITSUBISHI MATERIALS CORP |
发明人 |
KOMATSU RYUICHI;SUGIHARA TADASHI |
分类号 |
G01N33/20;H01B1/16;H01G4/12;H01G4/252;H01G13/00 |
主分类号 |
G01N33/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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