发明名称 INSPECTION OF BAKING ELECTRODE OF CHIP TYPE ELECTRONIC PART
摘要 PURPOSE:To mainly inspect the solderability of a baking electrode simply and accurately within a relatively short time and to support the accurate preparation of conductive paste good in electrode characteristics. CONSTITUTION:In the inspection of the soldering aptitude of the baking electrodes 12, 12 of a chip type electronic part 10 produced by coating the terminal part of a bare chip 11 with a conductive paste composed of a mixture of a metal powder containing Ag, glass fine particles and an org. vehicle and baking the coated part, the chip type electronic part 10 is allowed to stand in gas containing a predetermined amt. of a sulfur component for a predetermined time and the baking electrodes 12, 12 are optically observed. The surface hue of the electrodes changes corresponding to the exposure degree of the Ag component.
申请公布号 JPH07270400(A) 申请公布日期 1995.10.20
申请号 JP19940058436 申请日期 1994.03.29
申请人 MITSUBISHI MATERIALS CORP 发明人 KOMATSU RYUICHI;SUGIHARA TADASHI
分类号 G01N33/20;H01B1/16;H01G4/12;H01G4/252;H01G13/00 主分类号 G01N33/20
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