发明名称 HEAT TREATING METHOD
摘要 PURPOSE:To rapidly raise the temp. of the body to be treated such as a semicon ductor wafer to a prescribed temp., furthermore executing heat treatment at a stable temp. and therefore subjecting the wafer to uniform heat treatment at the time of executing oxidizing treatment and diffusing treatment thereto. CONSTITUTION:A heat controlling sheet 3 provided in the upper direction of a reaction tube 1 is heated by a heating means 22 to form a primary heating area in which temp. is substantially uniform to the change of the position of the height on the upper part of the reaction tube and a secondary heating area in which temp. is mildly decreased as it proceeds to the lower direction. After the temp. of a wafer W is rapidly increased to the primary heating area, it is mildly decreased within the secondary heating area, and in the meantime, heat treatment is executed.
申请公布号 JPH07268627(A) 申请公布日期 1995.10.17
申请号 JP19940087472 申请日期 1994.03.31
申请人 TOKYO ELECTRON LTD;TOKYO ELECTRON TOHOKU LTD 发明人 YAGI YASUSHI;OKASE WATARU
分类号 C23C14/50;H01L21/22;H01L21/31;H01L21/324;(IPC1-7):C23C14/50 主分类号 C23C14/50
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