发明名称 MICROWAVE INSPECTION METHOD AND DEVICE THEREFOR
摘要 <p>PURPOSE:To allow the non-destructive detection of a detection object in a vessel, regardless of the weight thereof, by forming the second spatial standing wave due to the electromagnetic wave of the first spatial standing wave reflected with an inspection object, so as to intersect the first spatial standing wave, and measuring the electric power of the second spatial standing wave. CONSTITUTION:A part of electromagnetic waves emitted from an electromagnetic wave emission unit 6, repeatedly reciprocates and mutually interferes in space between reflective planes 10 and 24 as nodal points, after reflected with an inspection object. The second spatial standing wave K having an amplitude so large as to correspond to the first spatial standing wave J is thereby formed. Then, the electric power of the standing wave K is detected with the electromagnetic sensor 22 of an electromagnetic wave receiving unit 9, and inputted to a discrimination means 22, thereby making judgement about whether a prescription sheet (detection object) 4 exists in a package (vessel) 1. As a result, the existence of the sheet 4 in the package 1 can be inspected in non- contact state without any breakage thereof, while not using any of a weight change and an ultrasonic wave, or a precious magnetic ink and a magnetic sensor.</p>
申请公布号 JPH07260944(A) 申请公布日期 1995.10.13
申请号 JP19940055764 申请日期 1994.03.25
申请人 HEWTEC:KK 发明人 NISHINO TSUTOMU;MORITOMO MITSUNARI;HANABUSA HIDEYUKI
分类号 G01V3/12;G01N22/00;(IPC1-7):G01V3/12 主分类号 G01V3/12
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