发明名称 CONDUCTING SPRING FOR A CIRCUIT INTERRUPTER TEST CIRCUIT
摘要 <p>A conducting spring (102) for exerting a biasing force against a test button (22) to open a circuit interrupter test circuit (84). The spring (102) includes a one-piece, elongated cantilever (104) having a first (106) and second (110) end. The cantilever (104) is formed from an electrically conducting material. One of the cantilever ends (106) is adapted to directly secure to a first terminal (44) of the test circuit (84). The other cantilever end (110) is adapted to directly and reversibly contact a second terminal (126) of the test circuit (84). The spring (102) also includes means for resiliently flexing the second end (110) of the cantilever (104) in relation to the first end (106). The flexing means (134) is integrally formed with the cantilever. Also provided is a ground fault circuit interrupter and a ground fault circuit module (84) for protecting a circuit interrupter with a push-to-test feature (22).</p>
申请公布号 WO1995027301(P1) 申请公布日期 1995.10.12
申请号 US1995003887 申请日期 1995.03.30
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