| 摘要 |
Apparatus for providing high speed control of digital test patterns and analog instruments in automatic circuit testing apparatus including a sequence controller including a random access memory ("RAM") for microcode and an address generator for selectively addressing instructions in said random access memory, a sequence address bus connected to the address generator of the sequence controller, digital test pattern RAM connected to the sequence address bus, and analog instruments including associated RAM loaded with microcode for the instruments and connected to the sequence address bus. |
