发明名称 |
Electron microscope, a camera for such an electron microscope, and a method of operating such an electron microscope |
摘要 |
An electron microscope uses a camera with a plurality of fluorescent elements separated by walls and a corresponding plurality of detector elements which receive light from fluorescent elements. The walls prevent electrons incident on one fluorescent element from affecting an adjacent fluorescent element, thereby reducing blurring of the image produced by the camera. The fluorescent elements may be connected to the detector elements by waveguides having filters which permit the intensity of light transmitted to each detector element to be adjusted to give a uniform response. The fluorescent elements may be arranged in a linear array, and the electron microscope is then operated to cause an image of a sample to scan across the array.
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申请公布号 |
US5457317(A) |
申请公布日期 |
1995.10.10 |
申请号 |
US19930121897 |
申请日期 |
1993.09.16 |
申请人 |
HITACHI, LTD. |
发明人 |
YONEHARA, KATSUHISA;KATSUTA, TEIJI;MATSUI, ISAO |
分类号 |
H01J37/22;H01J37/244;H01J37/26;H01J37/28;H01J37/295;(IPC1-7):G01N23/00 |
主分类号 |
H01J37/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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