发明名称 Method of manufacturing photo-mask and photo-mask manufactured thereby
摘要 A photo-mask and a method of manufacturing a photo-mask, which includes the steps of applying a resist film onto a substrate of quartz, glass and the like, subjecting the resist film to light exposure and development to form a fine resist pattern, etching the mask substrate covered by the fine resist pattern, causing a non-light transmitting thin film of Cr, Ta, etc. to adhere thereon by vapor deposition, sputtering and the like, and removing the thin film on the resist pattern together with the resist film, thereby to form the photo-mask.
申请公布号 US5457006(A) 申请公布日期 1995.10.10
申请号 US19910684680 申请日期 1991.03.29
申请人 SHARP KABUSHIKI KAISHA 发明人 HIROKANE, JUNJI;KATAYAMA, HIROYUKI;TAKAHASHI, AKIRA;INUI, TETSUYA;OHTA, KENJI;WASHO, JUNICHI;MIYAKE, TOMOYUKI;VAN, KAZUO;MIEDA, MICHINOBU
分类号 G03F1/00;G03F1/08;G03F1/14;G03F1/54;G03F1/68;G11B7/26;(IPC1-7):G03C5/00 主分类号 G03F1/00
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