发明名称 Metallographic microscope useful for the characterization of conductors drawing dies
摘要 A metallographic microscope for characterizing conductor drawing dies having a light collimating system, linear scales for horizontal and vertical axis of the platina, a positioning device on the platina, an electronic closed loop circuit for controlling the illumination through the collimating system, and a power supply and internal cabling within the body of the microscope for a video camera mounted to the lens system.
申请公布号 US5457571(A) 申请公布日期 1995.10.10
申请号 US19940280557 申请日期 1994.07.26
申请人 CENTRO DE INVESTIGACION Y DESARROLLO CONDUMEX SA.DE C. V. 发明人 LONGORIA, DANIEL A.;GARCIA, DANIEL C.;RUIZ, FERNANDO L.
分类号 G01B9/04;G02B21/00;G02B21/06;G02B21/36;(IPC1-7):G02B21/06 主分类号 G01B9/04
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