发明名称 |
Metallographic microscope useful for the characterization of conductors drawing dies |
摘要 |
A metallographic microscope for characterizing conductor drawing dies having a light collimating system, linear scales for horizontal and vertical axis of the platina, a positioning device on the platina, an electronic closed loop circuit for controlling the illumination through the collimating system, and a power supply and internal cabling within the body of the microscope for a video camera mounted to the lens system.
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申请公布号 |
US5457571(A) |
申请公布日期 |
1995.10.10 |
申请号 |
US19940280557 |
申请日期 |
1994.07.26 |
申请人 |
CENTRO DE INVESTIGACION Y DESARROLLO CONDUMEX SA.DE C. V. |
发明人 |
LONGORIA, DANIEL A.;GARCIA, DANIEL C.;RUIZ, FERNANDO L. |
分类号 |
G01B9/04;G02B21/00;G02B21/06;G02B21/36;(IPC1-7):G02B21/06 |
主分类号 |
G01B9/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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