发明名称 PROCESS INSTRUMENTATION RACK WITH CALIBRATION FUNCTION
摘要 <p>PURPOSE:To attain a highly accurate calibration test while relieving the load of a maintenance personnel and an adjustment personnel. CONSTITUTION:The process instrumentation rack is provided with a reference variable generating means 6 generating a reference variable fed to a instrument 3 to be calibrated, a reference device 8 whose measurement range is adjustable and measuring the reference process variable at the adjusted measurement range, a range adjustment means 9 matching the measurement range of the reference device 8 with the measurement range of the calibrated instrument 3 and a calibration means 9 comparing the measurement reference variable by the calibrated instrument 3 with the measurement reference variable by the reference device 8 to calculate the calibration variable of the calibrated instrument 3.</p>
申请公布号 JPH07253812(A) 申请公布日期 1995.10.03
申请号 JP19940045659 申请日期 1994.03.16
申请人 TOSHIBA CORP 发明人 KAGIFUKU TATSUO
分类号 G05B23/02;(IPC1-7):G05B23/02 主分类号 G05B23/02
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