发明名称 Process for fabricating a substrate with thin film capacitor and insulating plug
摘要 A thin-film bypass capacitor is fabricated by forming a plurality of through holes through the thickness of a nonconductive base substrate and filling the through holes with a conductive material to form ground vias and power vias. A sequence of back side metalization layers are applied to the back side surface of the base substrate. A sequence of bottom contact layers are applied to the front side surface of the base substrate. A bottom contact power terminal is formed in the bottom contact layer and is electrically isolated from remaining portions of the bottom contact layers by insulating plugs. A bottom contact metalization layer is applied to the surface of the bottom contact layers and the insulating plugs. A dielectric layer is formed on the surface of the bottom contact metalization layer. A ground metalization via and a power metalization via are formed at the surface of the dielectric layer. A sequence of top contact layers are applied to the surface of the dielectric layer and a front side ground terminal and front side power terminal are formed. A back side ground terminal and a back side power terminal are formed at the back side of the base substrate.
申请公布号 US5455064(A) 申请公布日期 1995.10.03
申请号 US19930151409 申请日期 1993.11.12
申请人 FUJITSU LIMITED 发明人 CHOU, WILLIAM T.;PETERS, MICHAEL G.;WANG, WEN-CHOU V.;WHEELER, RICHARD L.
分类号 H01G4/33;H01L21/822;H01L23/12;H01L23/50;H01L23/538;H01L23/64;H01L27/04;H05K1/11;H05K1/16;H05K3/46;(IPC1-7):B05D5/12 主分类号 H01G4/33
代理机构 代理人
主权项
地址