| 摘要 |
PURPOSE: To enhance the reliability by efficiently testing an electronic device fitted to a lead frame, and reducing the quantity of contaminant adhering to a testing fixture. CONSTITUTION: In a method for testing electronic devices 10, 12, 14 fitted to a lead frame 20, plural electronic devices 10, 12, 14 fitted to a common lead frame 20 are disposed under a testing fixture 50. The testing fixture 50 next comes into contact with the devices 10, 12, 14 to make an electric test. While being fitted to the common lead frame, plural devices are tested at one time, so that the efficiency of a test process is remarkably improved. Further, the devices 10, 12, 14 are disposed under the testing fixture 50, so that the quantity of contaminant staying on the testing fixture can be reduced. |
