发明名称 Phase shift mask and method for fabricating the same
摘要 A phase shift mask has a phase shift layer 13 with an inclined edge portion disposed above the boundary between the light transmitting support 11 and the light shielding pattern 12. The mask is made by applying a photoresist layer over the layer 13 and forming a pattem 15 etching the phase shift layer 13 so that inclined edge 14 is formed and then removing the resist pattern 15. The phase shift layer may be implanted with phosphorus ions to obtain a more gentle incline (Fig. 6B). <IMAGE>
申请公布号 GB2287799(A) 申请公布日期 1995.09.27
申请号 GB19950005720 申请日期 1995.03.21
申请人 * HYUNDAI ELECTRONICS INDUSTRIES CO. LTD. 发明人 YOUNG MOG * HAM
分类号 H01L21/027;G03F1/00 主分类号 H01L21/027
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