发明名称 |
METHOD OF ETCHING MULTI LEVEL RESIST |
摘要 |
(i)forming a lower resist film (2) on a semiconductor substrate (1): (ii)forming an intermediate layer (3) on the lower resist film(2); (iii)forming an upper resist film(9); (iv)patterning the irradiated the upper resist film using a patterning mask; (v)etching the intermediate layer(3) and the lower resist film(2) using the pattern of upper resist film(9) as etching mask in the named sequence to form an multi level resist pattern; and (vi) removing the pattern of upper resist film(9). The multi level resist pattern is produced by high accuracy.
|
申请公布号 |
KR950011171(B1) |
申请公布日期 |
1995.09.28 |
申请号 |
KR19920021764 |
申请日期 |
1992.11.19 |
申请人 |
LG SEMICONDUCTOR CO., LTD. |
发明人 |
LEE, JUN - SOK |
分类号 |
G03F7/26;(IPC1-7):G03F7/26 |
主分类号 |
G03F7/26 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|