发明名称 METHOD OF ETCHING MULTI LEVEL RESIST
摘要 (i)forming a lower resist film (2) on a semiconductor substrate (1): (ii)forming an intermediate layer (3) on the lower resist film(2); (iii)forming an upper resist film(9); (iv)patterning the irradiated the upper resist film using a patterning mask; (v)etching the intermediate layer(3) and the lower resist film(2) using the pattern of upper resist film(9) as etching mask in the named sequence to form an multi level resist pattern; and (vi) removing the pattern of upper resist film(9). The multi level resist pattern is produced by high accuracy.
申请公布号 KR950011171(B1) 申请公布日期 1995.09.28
申请号 KR19920021764 申请日期 1992.11.19
申请人 LG SEMICONDUCTOR CO., LTD. 发明人 LEE, JUN - SOK
分类号 G03F7/26;(IPC1-7):G03F7/26 主分类号 G03F7/26
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