PROBE FOR EDDY-CURRENT FLAW DETECTION,申请号JP19940040742-传众专利搜索

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发明名称	PROBE FOR EDDY-CURRENT FLAW DETECTION
摘要
申请公布号	JPH07248314(A)	申请公布日期	1995.09.26
申请号	JP19940040742	申请日期	1994.03.11
申请人	TOSHIBA CORP	发明人	IWAI OSAMU
分类号	G01R1/06;G01N27/90;(IPC1-7):G01N27/90	主分类号	G01R1/06
代理机构		代理人
主权项
地址

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