发明名称 PICTURE INSPECTION DEVICE
摘要 PURPOSE:To facilitate the analysis of an image even if the surface of an inspection object is lustrous or uneven by storing input image data when respective optical path opening/closing parts are sequentially opened through the use of plural light sources executing binarization/arithmetic processings and executing a logical operation corresponding to the surface form of the inspection object and the irradiation angle of illumination light. CONSTITUTION:The inspection object 3 when the illumination light of the light sources 1a and 1b different in angles are sequentially opened by the optical path opening/closing parts 2a and 2b is image-picked up by a camera 4, and they are stored in multilevel image memories 6a and 6b as multilevel digital image data. Respective binarization parts 7a and 7b simultaneously binarize image data stored in the memories 6a and 6b, and output them to a logical operation part 8. In the logical operation part 8, the AND-operation and the OR-operation of two pieces of binary image data are executed by an AND part 9 and an OR part 10, and data are inputted and stored in a binary image memory 11. An image analysis part 12 selects which binary image data stored in the memory 11 is to be analysized by adjusting it to the surface form of the inspection object 3.
申请公布号 JPH07249121(A) 申请公布日期 1995.09.26
申请号 JP19940041191 申请日期 1994.03.11
申请人 MITSUBISHI ELECTRIC CORP 发明人 FUJIMURA SHIGEO
分类号 G01N21/88;G01N21/17;G06T1/00;G06T5/00;G06T7/00 主分类号 G01N21/88
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