FLAW INSPECTING METHOD FOR APPEARANCE INSPECTING DEVICE,申请号JP19940056734-传众专利搜索

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发明名称	FLAW INSPECTING METHOD FOR APPEARANCE INSPECTING DEVICE
摘要
申请公布号	JPH07243976(A)	申请公布日期	1995.09.19
申请号	JP19940056734	申请日期	1994.03.02
申请人	TOYO COMMUN EQUIP CO LTD	发明人	MINOGUCHI AKIRA
分类号	G01N21/88;G01N21/958;(IPC1-7):G01N21/88	主分类号	G01N21/88
代理机构		代理人
主权项
地址

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