发明名称 IN-CIRCUIT TESTING METHOD FOR CAPACITOR
摘要 PURPOSE:To effectively inspect whether a capacitor having smaller electrostatic capacitance is electrically connected or not. CONSTITUTION:A ceramic capacitor 3 connected in parallel with an electrolytic capacitor 2 has smaller electrostatic capacitance than a tolerance of that of the capacitor 2. In the case of executing an in-circuit testing method, a frequency (10MHz) at the time when an impedance of the capacitor 3 becomes smaller (substantially zero) than that of the capacitor 2, is decided, and a voltage of a half waveform having its frequency is input to an electric circuit 1. A voltage to be output from the circuit 1 is measured, and an absolute value of its output voltage is compared with a judging value. The judging value is smaller than the output voltage of the circuit 1 when only the capacitor 2 is electrically connected. It is judging that the capacitor 3 is connected only when the absolute value of the output voltage is the judged value or less.
申请公布号 JPH07244098(A) 申请公布日期 1995.09.19
申请号 JP19940033783 申请日期 1994.03.03
申请人 TOYOTA MOTOR CORP 发明人 MORI HIDEO
分类号 G01R27/26;G01R31/28;H01G13/00 主分类号 G01R27/26
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