首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
Verfahren zur Synchronisation vom Impulsrahmen
摘要
申请公布号
DE4407794(A1)
申请公布日期
1995.09.14
申请号
DE19944407794
申请日期
1994.03.09
申请人
ALCATEL SEL AKTIENGESELLSCHAFT, 70435 STUTTGART, DE
发明人
GEYWITZ, KLAUS, DIPL.-ING., 70839 GERLINGEN, DE;VELOSO, ARTUR, DIPL.-ING., 73035 GOEPPINGEN, DE
分类号
H04B7/26;H04J3/06;H04M1/733;(IPC1-7):H04J3/06;H04Q7/20
主分类号
H04B7/26
代理机构
代理人
主权项
地址
您可能感兴趣的专利
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
METHOD OF MANUFACTURING NITRIDE SEMICONDUCTOR LASER DEVICE
NEW METHOD OF MANUFACTURING VARIABLE LENGTH VERTICAL TRANSISTOR
FORMATION METHOD FOR IMPROVED PLASMA NITRIDATION OF ULTRA-THIN GATE DIELECTRICS
LEAD FRAME MATERIAL, MANUFACTURING METHOD, AND SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD
SUPERCONDUCTING CIRCUIT AND ITS MANUFACTURING METHOD
HEAT SINK
SUBSTRATE FOR PACKAGE AND ITS MANUFACTURING METHOD
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
PROCESS FOR PRODUCING LAMINATED ALUMINUM SOLID ELECTROLYTIC CAPACITOR AND CAPACITOR PRODUCED BY THAT METHOD
MAGNETIC STORAGE AND ITS MANUFACTURING METHOD
DOPING METHOD AND DEVICE THEREFOR
APPARATUS FOR MANUFACTURING POLYCRYSTALLINE SILICON FILM, MANUFACTURING METHOD BY USING THE SAME, AND SEMICONDUCTOR DEVICE
METHOD FOR MANUFACTURING RESIN SEALED SEMICONDUCTOR DEVICE
METHOD FOR MEASURING THICKNESS OF BURIED MATERIAL, METHOD FOR REGULATING THICKNESS OF BURIED MATERIAL USING THE SAME, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
METHOD OF MANUFACTURING ELECTRONIC COMPONENT USING BARE CHIP COMPONENT
FASTENER FOR FIXING MODULAR JACK WITH BROKEN LOCKING ARM WITH MODULAR PLUG
PICTURE DISPLAY DEVICE
GROUNDING ELECTRODE MATERIAL INSERTION AUXILIARY DEVICE
ELECTROLUMINESCENT ELEMENT AND ITS MANUFACTURING METHOD, ELECTROLUMINESCENT DISPLAY, AS WELL AS COMPOUND SUBSTRATE
