发明名称 |
MASKING METHOD USED IN SALICIDE PROCESS |
摘要 |
A mask opening (52) used to etch exposed oxide spacer portions (37, 40) is made to not expose any parasitic oxide spacers (44) formed along an edge of the isolated silicon island (12). The desired oxide spacers (38, 39) will thus be intact to properly isolate silicide portions formed over exposed silicon and polysilicon surfaces. This process may be used during the formation of a bipolar or MOS transistor formed in an isolated silicon island (12).
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申请公布号 |
WO9524731(A1) |
申请公布日期 |
1995.09.14 |
申请号 |
WO1995US00798 |
申请日期 |
1995.01.20 |
申请人 |
NATIONAL SEMICONDUCTOR CORPORATION |
发明人 |
GRUBISICH, MICHAEL;BLAIR, CHRISTOPHER, S. |
分类号 |
H01L21/768;(IPC1-7):H01L21/768 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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