发明名称 MASKING METHOD USED IN SALICIDE PROCESS
摘要 A mask opening (52) used to etch exposed oxide spacer portions (37, 40) is made to not expose any parasitic oxide spacers (44) formed along an edge of the isolated silicon island (12). The desired oxide spacers (38, 39) will thus be intact to properly isolate silicide portions formed over exposed silicon and polysilicon surfaces. This process may be used during the formation of a bipolar or MOS transistor formed in an isolated silicon island (12).
申请公布号 WO9524731(A1) 申请公布日期 1995.09.14
申请号 WO1995US00798 申请日期 1995.01.20
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 GRUBISICH, MICHAEL;BLAIR, CHRISTOPHER, S.
分类号 H01L21/768;(IPC1-7):H01L21/768 主分类号 H01L21/768
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