发明名称 Partial-scan built-in self-testing circuit having improved testability
摘要 The testability of a near-acyclic circuit (14) can be enhanced by the addition of one or more control points (36) and observation points (34) to allow for increased observability and controllability of selected nodes (28). The control points (36) and/or test points (34) are added by first computing the controllability, observability and fault detection probability at each node. A fault is then selected. If either the controllability or observability for such fault is not inside a prescribed value range, and the fault detection probability is below a prescribed value, then either a control point (36) and/or a observation point (34) may be added.
申请公布号 US5450414(A) 申请公布日期 1995.09.12
申请号 US19930063191 申请日期 1993.05.17
申请人 AT&T CORP. 发明人 LIN, CHIH-JEN
分类号 G01R31/28;G01R31/3183;G01R31/3185;(IPC1-7):G06F11/00 主分类号 G01R31/28
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