| 摘要 |
A semiconductor integrated circuit device having internal circuits, and a test mode selecting circuit. The selecting circuit includes a first load device, a transistor having a first terminal receiving a signal via the first load device, a control terminal receiving a first voltage and a second terminal, and a second load device provided between the second terminal of the transistor and a reference voltage node. A test mode selecting signal is output via the second terminal of the transistor when a second voltage higher than the voltage of the signal applied to the first load device in a normal operation mode is applied thereto. The test mode selecting signal is applied to predetermined internal circuits among said internal circuits, so that the predetermined internal circuits are switched to states of a test mode from the normal operation mode.
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