发明名称 Method of manufacturing silicon substrate
摘要 A method of manufacturing a silicon single crystal substrate with the back surface thereof having deposited polycrystalline silicon. The method includes steps of depositing polycrystalline silicon on a coarsely polished silicon single crystal substrate, mirror surface finish polishing one substrate surface and carrying out a high temperature thermal treatment. The thermal treatment is carried out either prior or subsequent to the polycrystalline silicon deposition step. The thermal treatment has the effects of causing diffusion of interstitial oxygen Oi from the substrate surface to the outside and also causing contraction and vanishing of Oi precipitation nuclei in the substrate.
申请公布号 US5449532(A) 申请公布日期 1995.09.12
申请号 US19910783147 申请日期 1991.10.28
申请人 NEC CORPORATION 发明人 TOYOKAWA, FUMITOSHI
分类号 C23C16/02;C23C16/24;C23C16/56;C30B33/00;H01L21/304;H01L21/322;(IPC1-7):C23C16/24;B05D3/02 主分类号 C23C16/02
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