发明名称 |
Ion-sensitive FET prodn., useful for mfg. integrated liq. sensor circuit |
摘要 |
ISFET prodn. involves (a) structuring source, drain and ion-sensitive gate regions; (b) depositing a silicon oxide-silicon nitride double layer (12a, 12b) as gate insulator (12); (c) forming contact openings in the double layer above the source and drain regions; (d) depositing and structuring conductor lines (24, 28) which directly contact the source and drain regions; (e) depositing an insulating surface planarising layer (26, 26', 30); (f) etching a trench extending down to the double layer above the source and drain regions respectively adjacent the ion-sensitive region; (g) depositing a silicon carbide layer (38); and (h) etching a cavity (40) which is enclosed by the trench and which extends down to the double layer (12a, 12b) above the ion-sensitive region.
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申请公布号 |
DE4430811(C1) |
申请公布日期 |
1995.09.07 |
申请号 |
DE19944430811 |
申请日期 |
1994.08.30 |
申请人 |
FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V., 80636 MUENCHEN, DE |
发明人 |
HEIN, PETER, DIPL.-ING. DR., 85053 INGOLSTADT, DE;RAMM, PETER, DIPL.-PHYS. DR., 85276 PFAFFENHOFEN, DE |
分类号 |
G01N27/414;H01L21/8238;(IPC1-7):H01L21/336;H01L29/78 |
主分类号 |
G01N27/414 |
代理机构 |
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