发明名称 |
SEMICONDUCTOR WELL GUARD RING METHOD |
摘要 |
The semiconductor device having a second conductive type well resgions formed on a first conductive type substrate and a second conductive type well guard ring junction region formed surrounding the well region, includes: a first contact hole arranged in the first direction to expose the junction region; a first conductive ion implanting active region isolated by a channel region formed in the well region; a second contact hole arranged in the second direction to expose the active region region; a first conduction layer with which the first contact hole is filled, being extended in the second direction; a third contact hole formed by selectively etching an interlayer insulating film formed on the first conduction layer; and a second conduction layer in contact with the first conduction layer through the third contact hole and the active region through the second contact hole. The latch-up of CMOS circuit is effectively prevented without an increase of layout of semiconductor device.
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申请公布号 |
KR950010050(B1) |
申请公布日期 |
1995.09.06 |
申请号 |
KR19920009413 |
申请日期 |
1992.05.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SO, BO - SONG;KIM, SOK - BIN |
分类号 |
H01L27/04;H01L27/092;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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