Test pattern signal generator and inspection method of display device using the same.,申请号EP19920106264-传众专利搜索

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发明名称	Test pattern signal generator and inspection method of display device using the same.
摘要
申请公布号	EP0521249(B1)	申请公布日期	1995.09.06
申请号	EP19920106264	申请日期	1992.04.10
申请人	MITSUBISHI DENKI KABUSHIKI KAISHA	发明人	TERAZONO, MAKOTO, C/O DAITO ENGENEERING CORP.;EMMOTO, KAZUO, C/O MITSUBISHI DENKI K. K.
分类号	H01J9/42;H04N17/00;H04N17/04;(IPC1-7):H01J9/42;H04N17/02	主分类号	H01J9/42
代理机构		代理人
主权项
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