发明名称 FABRICATION OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To increase the depth of focus in the lithography step of semiconductor fabrication process. CONSTITUTION:A first photoresist film 3 is applied onto a film 2 to be micromachined and a second photoresist film 4, which is evaporated by the exposing light to decrease the thickness, is applied thereon. The second photoresist film 4 forms a concave lens during exposure thus increasing the depth of focus.
申请公布号 JPH07235467(A) 申请公布日期 1995.09.05
申请号 JP19940022979 申请日期 1994.02.22
申请人 NEC CORP 发明人 OFUJI TAKESHI
分类号 H01L21/027;G03F7/00;G03F7/09;G03F7/20;(IPC1-7):H01L21/027 主分类号 H01L21/027
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