发明名称 System for measuring tilt of image plane of optical system using diffracted light
摘要 A system used for measuring the tilt of an image formed by a lens. The measuring system has a light source, a diffraction grating, a reflection surface and a detector for detecting an interference pattern that is formed by the light after passing through the diffraction grating reflection surface and the lens.
申请公布号 US5448355(A) 申请公布日期 1995.09.05
申请号 US19940220682 申请日期 1994.03.31
申请人 ASAHI KOGAKU KOGYO KABUSHIKI KAISHA 发明人 NOGUCHI, MASATO;IIZUKA, TAKASHI
分类号 G01M11/02;(IPC1-7):G01B9/02 主分类号 G01M11/02
代理机构 代理人
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