发明名称 |
Semiconductor device having a planarized surface and method of manufacturing the same. |
摘要 |
An object of the present invention is to completely reduce a difference in level in a short time at a convex pattern spreading horizontally on a large scale and obtain a semiconductor device having a planarized surface. An insulating film (20) is formed on a semiconductor substrate (1) to cover a horizontally spreading convex pattern (83) and to fill in a concave portion (84). A portion of insulating film (20) located on a planarized portion of convex pattern (83) is selectively etched away so as to leave a frame-shaped insulating film (88) having a width of 1-500 mu m at least on the outer periphery portion of convex pattern (83). Insulating film (88) left on semiconductor substrate (1) is etched by chemical/mechanical polishing method, thereby planarizing a surface of the semiconductor substrate. <IMAGE> |
申请公布号 |
EP0669645(A1) |
申请公布日期 |
1995.08.30 |
申请号 |
EP19940115060 |
申请日期 |
1994.09.23 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
HAYASHIDE, YOSHIO, C/O MITSUBISHI DENKI K.K. |
分类号 |
H01L21/3205;H01L21/304;H01L21/306;H01L21/3105;H01L21/768;H01L23/52 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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