发明名称 Epitaxial wafer and process for producing the same
摘要 In order to grow a GaAs1-xPx fixed-composition layer of excellent quality, which has a predetermined composition x, over a GaAs or GaP single crystal substrate, a varied-composition layer is formed between the substrate and the fixed-composition layer. The varied-composition layer comprises at least two varied-composition layer portions and at least one fixed-composition layer portion with a predetermined thickness that is formed between the varied-composition layer portions, whereby dislocations caused by lattice mismatch with the GaP substrate are settled in the varied-composition layer portions and recovered in the fixed-composition layer portion between the varied-composition layer portions, thereby minimizing the dislocations, and thus making it possible to obtain a GaAs1-xPx layer of excellent crystal quality, which has a predetermined composition x.
申请公布号 US5445897(A) 申请公布日期 1995.08.29
申请号 US19930069672 申请日期 1993.06.01
申请人 MITSUBISHI KASEI POLYTEC COMPANY;MITSUBISHI KASEI CORPORATION 发明人 SATOH, TADASHIGE;FUJITA, HISANORI
分类号 H01L21/20;(IPC1-7):H01L21/20;H01L33/00 主分类号 H01L21/20
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