发明名称 BURN-IN TREATMENT METHOD FOR CAPACITOR
摘要 PURPOSE:To obtain high efficiency at low cost while reliability is being maintained by a method wherein a charge capacitor in an electrically insulated state is placed in a high temperature without application of voltage, and it is left alone for the prescribed period of time in that state. CONSTITUTION:The capacitor to be burn-in reated is charged by applying the prescribed voltage to the capacitor for the prescribed period of time. Then, an electrically insulated plate is prepared, and the charged capacitor is placed thereon. Subsequently, this capacitor is put in a testing vessel which is maintained at the high temperature of 85 to 95 deg.C, for example, and it is left there for the prescribed period of time. After an aging treatment has bean conducted, the capacitor is cooled by leaving it in the normal temperature. As a result, the capacitor can be burn-in treated at low cost in a highly efficient manner. Also, as it is unnecessary to apply voltage, the burn-in treatment device can be provided at low cost.
申请公布号 JPH07230939(A) 申请公布日期 1995.08.29
申请号 JP19940021712 申请日期 1994.02.21
申请人 MURATA MFG CO LTD 发明人 YAMAMOTO SHIGEKATSU
分类号 G01R31/00;G01R31/26;H01G13/00 主分类号 G01R31/00
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