| 摘要 |
PURPOSE:To measure distortion components by a simplified system and obtain an RF device for measuring distortion characteristic and its measuring method by which measurement can be carried out even when an interval of frequency between two waves is narrow. CONSTITUTION:The device is provided with a wave-synthesizing device 5 for synthesizing outputs from two signal sources 1 and 2, an amplifier 10 for an object to be measured that inputs distributed one distributed output from a distributor 6 for dividing the synthesized wave outputs into two, a reference distortion generator 15 that inputs the other distributed output and generates reference distortion, a synthesizing means 38a that synthesizes the output of the amplifier and the output of the reference distortion generator at a desired phase difference and amplitude, and a spectrum analyser for the output of the synthesizing means. The phase difference and amplitude between the outputs of the amplifier and reference distortion generator are adjusted so that a specific distortion component in the output of the synthesizing means may be counterbalanced against the input power level applied to the amplifier 10, thereby measuring the phase characteristic of distortion generating in the amplifier 10. |
