| 摘要 |
A probe board is provided with a guide-mask system. The probe board has at least one head which passes through a respective guide-hole located on the filmed guide-mask. The utilization of this guide-mask has the advantage of minimizing slipping of probe heads out of respective mating test terminals of IC chips. Additionally, the utilization of this guide-mask provides accurate probe head positioning and provides enforcement to the heads by way of the filmed guide-mask because of the precise support holes provided in the masks.
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