发明名称 |
NON-VOLATILE SEMICONDUCTOR MEMORY |
摘要 |
<p>PURPOSE:To suppress injecting electrons into a non-selection cell by applying low voltage to a selecting gate to which a non-selection cell belongs at the time of write-in and cutting off the selecting gate. CONSTITUTION:Selecting gates SG are respectively provided at both ends of plural memory cells connected in series to which each control gate CG is connected. Bit lines BL being a column line side are selected and controlled by a column decoder 13 through a data latch/sense circuit 11, a column gate 12. A selecting gate SG being a row line side and a control gate CG (word line) are selected and controlled by a row decoder 14. A booster circuit 15 generates high voltage for a substrate and a source line at the time of erasing and high voltage for a control gate at the time of write-in, a low voltage switching circuit 16 generates low voltage cutting off the selecting gate SG as prohibiting operation for write-in.</p> |
申请公布号 |
JPH07230695(A) |
申请公布日期 |
1995.08.29 |
申请号 |
JP19940304957 |
申请日期 |
1994.12.08 |
申请人 |
TOSHIBA CORP |
发明人 |
MATSUKAWA HISAHIRO;KIRISAWA RYOHEI;SHIRATA RIICHIRO |
分类号 |
G11C17/00;G11C16/02;G11C16/04;G11C16/06;(IPC1-7):G11C16/06 |
主分类号 |
G11C17/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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