发明名称 NON-VOLATILE SEMICONDUCTOR MEMORY
摘要 <p>PURPOSE:To suppress injecting electrons into a non-selection cell by applying low voltage to a selecting gate to which a non-selection cell belongs at the time of write-in and cutting off the selecting gate. CONSTITUTION:Selecting gates SG are respectively provided at both ends of plural memory cells connected in series to which each control gate CG is connected. Bit lines BL being a column line side are selected and controlled by a column decoder 13 through a data latch/sense circuit 11, a column gate 12. A selecting gate SG being a row line side and a control gate CG (word line) are selected and controlled by a row decoder 14. A booster circuit 15 generates high voltage for a substrate and a source line at the time of erasing and high voltage for a control gate at the time of write-in, a low voltage switching circuit 16 generates low voltage cutting off the selecting gate SG as prohibiting operation for write-in.</p>
申请公布号 JPH07230695(A) 申请公布日期 1995.08.29
申请号 JP19940304957 申请日期 1994.12.08
申请人 TOSHIBA CORP 发明人 MATSUKAWA HISAHIRO;KIRISAWA RYOHEI;SHIRATA RIICHIRO
分类号 G11C17/00;G11C16/02;G11C16/04;G11C16/06;(IPC1-7):G11C16/06 主分类号 G11C17/00
代理机构 代理人
主权项
地址