发明名称 |
MAKING METHOD OF HIGH SPEED TFT WITH THREE DIMENSIDNS CHANNEL STRUCTURE |
摘要 |
forming a polysilicon layer by depositing the polysilicon on a transparent sustrate; forming a gate insulating layer by thermal oxidating the polysilicon layer; forming a channel region by depositing a polysilicon on a whole surface and removing the polysilicon film and the gate insulating layer exclusive of trench region; forming an insulation film to surround the channel region by thermal oxidating the channel region; and forming a gate to surround the channel region by depositing a polysilicon. The obtained transistor is useful for ULSI elements.
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申请公布号 |
KR950009804(B1) |
申请公布日期 |
1995.08.28 |
申请号 |
KR19920011367 |
申请日期 |
1992.06.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, WON - KUN;KIM, CHOL - SU;HAN, JONG - IN |
分类号 |
H01L21/336;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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