发明名称 MAKING METHOD OF HIGH SPEED TFT WITH THREE DIMENSIDNS CHANNEL STRUCTURE
摘要 forming a polysilicon layer by depositing the polysilicon on a transparent sustrate; forming a gate insulating layer by thermal oxidating the polysilicon layer; forming a channel region by depositing a polysilicon on a whole surface and removing the polysilicon film and the gate insulating layer exclusive of trench region; forming an insulation film to surround the channel region by thermal oxidating the channel region; and forming a gate to surround the channel region by depositing a polysilicon. The obtained transistor is useful for ULSI elements.
申请公布号 KR950009804(B1) 申请公布日期 1995.08.28
申请号 KR19920011367 申请日期 1992.06.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, WON - KUN;KIM, CHOL - SU;HAN, JONG - IN
分类号 H01L21/336;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/336
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