发明名称 |
MANUFACTURIN METHOD OF SEMICONDUCTOR PRESSURE SENSOR |
摘要 |
joining a first substrate including a thermal oxide film(8) fromed on an n- silicon substrate(1) and a second sustrate including a p- epitaxy layer(7) formed on a p++ silicon substrate(10) so as to bring the thermal oxide film(8) and the epitaxy layer(7) together; joining a third substrate formed by etching the p++ silicon substrate(10) and a fourth sustrate including a piezoresistor(2) and a dielectrics separating oxide film(9) formed on a silicon substrate(1a) so as to bring the epitaxy layer(7) and the dielectrics separating oxide film(9) together; etching the silicon substrate(1a) using a first silicon film(13) as a mask; forming an electrode(4) on the piezoresistor, and forming a passivation oxide film(14) and a second silicon film(13a) on the dielectrics separating oxide film(9) in turn; forming a diaphragm pattern of the silicon films(13)(13a); and forming a thin silicon diaphragm(3) by etching the n- silicon substrate(1). The method can improve an output response chracteristic to temperature, product the homogeneous diaphragm, and control the thickness of the diaphragm. |
申请公布号 |
KR950009638(B1) |
申请公布日期 |
1995.08.25 |
申请号 |
KR19920026629 |
申请日期 |
1992.12.30 |
申请人 |
KOREA ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE |
发明人 |
CHONG, KUI - SANG;AN, KUN - YONG;KANG, JIN - YONG;KANG, SANG - WON |
分类号 |
H01L41/27;(IPC1-7):H01L41/00 |
主分类号 |
H01L41/27 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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