发明名称 MANUFACTURIN METHOD OF SEMICONDUCTOR PRESSURE SENSOR
摘要 joining a first substrate including a thermal oxide film(8) fromed on an n- silicon substrate(1) and a second sustrate including a p- epitaxy layer(7) formed on a p++ silicon substrate(10) so as to bring the thermal oxide film(8) and the epitaxy layer(7) together; joining a third substrate formed by etching the p++ silicon substrate(10) and a fourth sustrate including a piezoresistor(2) and a dielectrics separating oxide film(9) formed on a silicon substrate(1a) so as to bring the epitaxy layer(7) and the dielectrics separating oxide film(9) together; etching the silicon substrate(1a) using a first silicon film(13) as a mask; forming an electrode(4) on the piezoresistor, and forming a passivation oxide film(14) and a second silicon film(13a) on the dielectrics separating oxide film(9) in turn; forming a diaphragm pattern of the silicon films(13)(13a); and forming a thin silicon diaphragm(3) by etching the n- silicon substrate(1). The method can improve an output response chracteristic to temperature, product the homogeneous diaphragm, and control the thickness of the diaphragm.
申请公布号 KR950009638(B1) 申请公布日期 1995.08.25
申请号 KR19920026629 申请日期 1992.12.30
申请人 KOREA ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 CHONG, KUI - SANG;AN, KUN - YONG;KANG, JIN - YONG;KANG, SANG - WON
分类号 H01L41/27;(IPC1-7):H01L41/00 主分类号 H01L41/27
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