发明名称 Mfg. ohmic contacts on n-doped compound semiconductor layer
摘要 The contact forming process is for a III-V compound semiconductor. First a metal contact layer is deposited onto the n-doped semiconductor layer. The metal layer is coated with an Au layer, and finally the metal structure is heat treated for tempering. The metal coated layer consists of an AuGeNi alloy, with the Ge and Ni proportion not exceeding 1% wt. Pref. the layered structure is heat treated at 360 to 390 deg.C for 110 to 180 minutes. With the temp. raised to 430 to 480 deg.C the treatment period may be 5 to 20 seconds. The Ni proportion may be 0.5% wt., and that of Ge 0.4% wt.
申请公布号 DE4405716(A1) 申请公布日期 1995.08.24
申请号 DE19944405716 申请日期 1994.02.23
申请人 TEMIC TELEFUNKEN MICROELECTRONIC GMBH, 74072 HEILBRONN, DE 发明人 GERNER, JOCHEN, DIPL.-PHYS., 69168 WIESLOCH, DE
分类号 H01L21/28;H01L21/203;H01L21/285;H01L29/45;(IPC1-7):H01L21/285 主分类号 H01L21/28
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