发明名称 |
AC interconnect test of integrated circuit chips |
摘要 |
An integrated circuit chip (110) adapted to provide interconnect capability and an AC interconnect test method therefor. Test and control data are scanned in the scan-path of latches (114 and 115) to initialize the AC interconnect test. Subsequently the functional system mode is simulated by applying the functional-system clocks via lines (118 and 128). |
申请公布号 |
US5444715(A) |
申请公布日期 |
1995.08.22 |
申请号 |
US19930069466 |
申请日期 |
1993.06.01 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
GRUETZNER, MATTHIAS;STARKE, CORDT W. |
分类号 |
G01R31/02;G01R31/28;G01R31/3185;H01L21/66;H01L21/822;H01L27/04;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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