发明名称 ABNORMALITY DETECTION DEVICE FOR MEASURING INSTRUMENT
摘要 <p>PURPOSE:To detect abnormality of the measuring instrument by generating a multidimensional autoregressive model by using measured values of the state of a system, calculating the predicted value of the measuring instrument from the multidimensional autoregressive model and the measured values, and comparing the calculated predicted value with measured values in a measured value storage device. CONSTITUTION:The measured value storage device 18 is stored with the measured values which are measured in a certain time by respective measuring instruments and an autoregressive model generation device 19 inputs the stored measured values and generates the autoregressive model. A predicted value arithmetic unit 20 calculates predicted values of the respective measuring instruments at time (n) and outputs them to an arithmetic unit 21. The arithmetic unit 21 find the differences between the calculated predicted values of the respective measuring instruments and the values of the time (n) in the measured value storage device 18 and outputs the differences to an abnormal value storage device 24. The abnormal value decision device 24 decides whether or not the differences between the predicted values of the respective measuring instruments that are calculated by the predicted value arithmetic unit 20 and the measured values in the measured value storage device 18 are less than the arithmetic value calculated by a decision reference value arithmetic unit 22 and displays the result on a display device 17.</p>
申请公布号 JPH07219623(A) 申请公布日期 1995.08.18
申请号 JP19940031936 申请日期 1994.02.02
申请人 YASKAWA ELECTRIC CORP 发明人 HIRABAYASHI KAZUYA;KANETANI TOSHINORI
分类号 G05B23/02;G01D21/00;(IPC1-7):G05B23/02 主分类号 G05B23/02
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