TESTING METHOD FOR NONVOLATILE MEMORY

摘要

PURPOSE: To execute a test faster by excluding an internal state machine and directly programming a cell matrix to testify that the program is correct. CONSTITUTION: A test circuit 10 receives a test mode active signal from an address bus 2 and a data bus 3, the positions of switches I1 to 3 are switched. The switch I1 is switched to a second circuit 8 (programming circuit) connecting a signal WEN to a memory matrix. The switch I2 is switched to a first circuit 6 (generator) connecting a signal CEN to a circuit 2 and a word line. The switch 3 directly input a signal OPE to the circuit 6 and an output buffer circuit 7. As the result of this, the internal state machine is excluded and addresses can freely be used. Then a new test method programming a desired cell through the use of a control signal with a new meaning and testifying that the program is correct is obtained.