发明名称 DEVICE AND METHOD FOR INSPECTING PATTERN OF LOGO MARK OR THE LIKE AND DEVICE FOR PREPARING PATTERN DICTIONARY OF LOGO MARK OR THE LIKE
摘要 PURPOSE:To inspect a pattern even when the pattern is such a pattern that adjacent characters overlapping upon another by registering reference patterns, etc., segmented at every small block. CONSTITUTION:Reference patterns obtained by segmenting the reference pattern of a logo mark, etc., at every segmenting area are registered as dictionary patterns. At the same time, each information indicating the position and size of each segmenting area and division of each small block is registered. Then the picture of the pattern of a logo mark, etc., to be inspected is taken and the taken video pattern is divided into the segmenting areas and small blocks based on each registered information. Thereafter, the small block segmenting pattern is matched to the reference patterns. Namely, a CPU 1 performs these processes on a pattern to be inspected which is an actual image fetched to an auxiliary memory 3 from a TV camera 7 and, at the same time, performs pattern matching, etc., against the dictionary patterns. Thus the propriety of the pattern to be inspected is discriminated.
申请公布号 JPH07218446(A) 申请公布日期 1995.08.18
申请号 JP19940014307 申请日期 1994.02.08
申请人 HITACHI ENG CO LTD 发明人 OZAWA TETSUO;NISHI HIROISA;ATSUTA NOBUYASU
分类号 G01N21/88;G01N21/93;G06K9/20;G06T1/00;G06T7/00 主分类号 G01N21/88
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