发明名称 Device to measure the thickness profile of a metallic product such as a running band or slab.
摘要 The device emits X-rays towards the metal strip, and detection unit (21) on the other side of the strip detects the out-going X-rays, which are treated (22) to measure strip thickness and the resultant reading transmitted to the operator. The detector and treater are mounted on a support plate (18), with a closure plate (19) at one end, carrying electrical (27) and fluid (25,26) connections. The support plate is inserted in an enclosure, with a flange fixing for the closure plate, with a seal between the joint. The enclosure has an X-ray permeable window adjacent to the detector unit, towards the product and a protective screen, absorbing X-rays, covering any susceptible circuit components. The closure plate fluid connections provide liquid coolant.
申请公布号 EP0667508(A1) 申请公布日期 1995.08.16
申请号 EP19950400228 申请日期 1995.02.03
申请人 SOLLAC 发明人 CAMPAS, JEAN-JACQUES;TERREAUX, STEPHANE;VANHEE, PATRICK
分类号 B21B37/00;B21B38/02;B21C51/00;G01B15/02 主分类号 B21B37/00
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