发明名称 Photomask and projection exposure mechanism using the same
摘要 A photomask for receiving light for exposure from a light source and projecting the emitted light onto a resist film on a wafer through an optical system so as to pattern the resist film includes a plurality of light transmitting portions for transmitting the light for exposure through a converging portion, and a convex portion made of a transparent or translucent material. The convex portion is formed protruding into the side on which the wafer is provided in order to cover the light transmitting portions so that the light for exposure is emitted as transmitted light which can form an image on the imaging plane of the wafer by utilizing refractive effects.
申请公布号 US5441835(A) 申请公布日期 1995.08.15
申请号 US19930137802 申请日期 1993.10.18
申请人 SHARP KABUSHIKI KAISHA 发明人 HARAZAKI, KATSUHIKO
分类号 G03F1/60;G03F1/68;G03F1/70;G03F7/20;H01L21/027;H01L21/30;(IPC1-7):G03F9/00 主分类号 G03F1/60
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