TEST OF LIQUID CRYSTAL PANEL

摘要

PURPOSE:To guarantee the performance of image quality when the characteristic change of a thin film transistor occurs by performing the inspection wherein the occurrence of the characteristic change of the thin film transistor is assumed. CONSTITUTION:As the quantitative numerical values indicating the characteristic change of a liquid crystal panel using a thin film transistor caused by long-time driving, the ON level and the OFF level of a scanning signal and changed. The value, at which the luminance difference reaches the quality judging luminance in comparison with the initial value is adopted. As a result, the changing amounts of DELTAVg(H) and DELTAVg(L) are obtained with respect to the initial values Vg(H) and Vg(L). Therefore, the ON level of the scanning signal at the time of test is set at Vg(H)-DELTAVg(H) (where DELTAVg(H)>0), and the OFF level is set at Vg(L)+DELTAVg(L) (where DELTAVg(L)>0). In this way, the inspection, wherein the quality-judging-limit luminance is not exceeded and the image- quality performance of the liquid crystal panel is ensured, can be performed.