发明名称 Photo varnish film development method for semiconductor mfr.
摘要 The method involves applying a varnish solution (19) to an uneven surface of a wafer (11) to give a coating with a smooth surface. The wafer is then inverted on a lathe to bring the smooth varnish side downwards and is then rotated at high speed. A photo varnish film formed has an uneven surface along the topology of the wafer but has a film thickness constant at all points.
申请公布号 DE19503388(A1) 申请公布日期 1995.08.10
申请号 DE19951003388 申请日期 1995.02.02
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD., ICHON, KYUNGKI, KR 发明人 BAE, SANG MAN, ICHON, KYONGGI, KR
分类号 G03F7/16;(IPC1-7):G03F7/16 主分类号 G03F7/16
代理机构 代理人
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